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Inter-comparison of Wheat Models to Identify Knowledge Gaps and Improve Process Modeling [Abstract]

by Enli Wang, P. Martre, Senthold Asseng, F. Ewert, Zhao Zhigan, Andrea Maiorano, Reimund Roetter, B. A. Kimball, M. J. Ottman, G. W. Wall, Jeffrey White, P. K. Aggarwal, P. D. Alderman, J. Anothai, B. Basso, Christian Biernath, Davide Cammarano, Andy Challinor, G. De Santis, Jordi Doltra, E. Fereres, M. Garcia-Vila, Sebastian Gayler, Gerrit Hoogenboom, Leslie Hunt, Roberto Izaurralde, M. Jabloun, C. D. Jones, Kurt Christian Kersebaum, A.-K. Koehler, Christoph Mueller, L. Liu, Naresh Kumar, Claas Nendel, Garry O'Leary, Jorgen Olesen, Taru Palosuo, Eckart Priesack, M. P. Reynolds, Ali Rezaian, E. Eyshi Rezai, Dominique Ripoche, A. C. Ruane, Mikhail Semenov, Iurii Shcherbak, Claudio O. Stoeckle, Pierre Stratonovitch, T. Streck, Iwan Supit, Fulu Tao, Peter Thorburn, Katharina Waha, D. Wallach, Joost Wolf, Yan Zhu ยท 2016

ISBN:  Unavailable

Category: Unavailable

Page count: Unavailable

Coded by Alvin Chou